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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">nguphys</journal-id><journal-title-group><journal-title xml:lang="ru">Сибирский физический журнал</journal-title><trans-title-group xml:lang="en"><trans-title>SIBERIAN JOURNAL OF PHYSICS</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2541-9447</issn><publisher><publisher-name>Новосибирский государственный университет</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.25205/2541-9447-2018-13-4-74-90</article-id><article-id custom-type="elpub" pub-id-type="custom">nguphys-66</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ФИЗИКА ТВЕРДОГО ТЕЛА, ПОЛУПРОВОДНИКОВ, НАНОСТРУКТУР</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>SOLID-STATE AND SEMICONDUCTOR PHYSICS, PHYSICS OF NANOSTRUCTURES</subject></subj-group></article-categories><title-group><article-title>Прохождение электрона через туннельный плавный барьер в высокочастотном поле</article-title><trans-title-group xml:lang="en"><trans-title>Electron Transmission through a Smooth Tunnel Barrier in High-Frequency Field</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ткаченко</surname><given-names>О. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tkachenko</surname><given-names>O. A.</given-names></name></name-alternatives><email xlink:type="simple">otkach@list.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ткаченко</surname><given-names>В. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Tkachenko</surname><given-names>V. A.</given-names></name></name-alternatives><email xlink:type="simple">vtkach@isp.nsc.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Бакшеев</surname><given-names>Д. Г.</given-names></name><name name-style="western" xml:lang="en"><surname>Baksheyev</surname><given-names>D. G.</given-names></name></name-alternatives><email xlink:type="simple">d.baksheev@g.nsu.ru</email><xref ref-type="aff" rid="aff-3"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Институт физики полупроводников им. А. В. Ржанова СО РАН</institution><country>Россия</country></aff><aff xml:lang="en"><institution>A. V. Rzhanov Institute of Semiconductor Physics SB RAS</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Институт физики полупроводников им. А. В. Ржанова СО РАН; Новосибирский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>A. V. Rzhanov Institute of Semiconductor Physics SB RAS; Novosibirsk State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Новосибирский государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Novosibirsk State University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2018</year></pub-date><pub-date pub-type="epub"><day>26</day><month>10</month><year>2020</year></pub-date><volume>13</volume><issue>4</issue><fpage>74</fpage><lpage>90</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ткаченко О.А., Ткаченко В.А., Бакшеев Д.Г., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Ткаченко О.А., Ткаченко В.А., Бакшеев Д.Г.</copyright-holder><copyright-holder xml:lang="en">Tkachenko O.A., Tkachenko V.A., Baksheyev D.G.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://nguphys.elpub.ru/jour/article/view/66">https://nguphys.elpub.ru/jour/article/view/66</self-uri><abstract><p>Численно изучено фотонно-ассистированное прохождение электрона через одномерный плавный барьер, моделирующий потенциал в нижней энергетической подзоне квантового точечного контакта. Показано, что на зависимостях коэффициента прохождения от энергии присутствуют плечеобразные особенности, которые на частотных зависимостях трансформируются в максимумы. Особенности вызваны переходами в канал с энергией, близкой к вершине барьера, при поглощении одного, двух или трех фотонов, и их положение не зависит от амплитуды высокочастотного поля. С понижением частоты фотон-индуцированные ступени исчезают, но в производной коэффициента прохождения от энергии остаются два пика, равноотстоящие по энергии от средней высоты барьера на амплитуду колебаний высоты барьера. Найденные особенности предлагается наблюдать экспериментально при облучении полупроводниковой структуры с квантовым точечным контактом на частотах 0,01-1,7 ТГц.</p></abstract><trans-abstract xml:lang="en"><p>The photon-assisted transmission of an electron through a smooth one-dimensional barrier that simulates the potential in the lower energy subband of the quantum point contact is numerically studied. The dependence of the transmission coefficient on energy shows shoulder-like features, that frequency dependence transforms into maxima. The features are caused by transitions into a channel with the energy close to the top of the barrier when one, two or three photons are absorbed, and their position does not depend of the amplitude of the high-frequency field. With decreasing frequency, the photon-induced steps disappear, but the derivative of the transmission coefficient on energy shows two peaks placed at points lower and higher average height of the barrier on the value equal the amplitude of oscillations. The discovered features can be observed experimentally upon irradiation of a semiconductor structure with a quantum point contact at frequencies 0.01-1.7 THz.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>туннелирование</kwd><kwd>надбарьерное прохождение</kwd><kwd>квантовый точечный контакт</kwd><kwd>ступень кондактанса</kwd><kwd>микроволны</kwd><kwd>терагерцы</kwd><kwd>низкочастотные особенности</kwd><kwd>фотонно-ассистированное прохождение</kwd></kwd-group><kwd-group xml:lang="en"><kwd>tunneling</kwd><kwd>over-barrier transmission</kwd><kwd>quantum point contact</kwd><kwd>conductance step</kwd><kwd>microwaves</kwd><kwd>terahertz</kwd><kwd>low-frequency features</kwd><kwd>photon-assisted transmission</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Dayem A. H., Martin R. J. Quantum interaction of microwave radiation with tunneling. Phys. Rev. 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